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• W2033608617 abstract "The amphoteric nature of Si/SiO2 interface states in submicron sized metal-oxide-silicon-field-effect-transistors is observed using an enhanced spectroscopic charge pumping method. The method’s simplicity and high sensitivity makes it a powerful tool for interrogating the true nature of electrically measured interface states in samples which exhibit extremely low defect densities. The spectroscopic results obtained clearly illustrate a signature “double peak” density of states consistent with amphoteric Pb center data obtained from electron spin resonance measurements. Since the method is a hybrid of the commonly used charge pumping methodology, it should find widespread use in electronic device characterization." @default.
• W2033608617 created "2016-06-24" @default.
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• W2033608617 date "2011-06-06" @default.
• W2033608617 modified "2023-10-14" @default.
• W2033608617 title "Spectroscopic charge pumping investigation of the amphoteric nature of Si/SiO2 interface states" @default.
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• W2033608617 doi "https://doi.org/10.1063/1.3597298" @default.
• W2033608617 hasPublicationYear "2011" @default.
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