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- W2034009276 abstract "We show that, contrary to intuition and under normal experimental conditions, the band bending at a semiconductor surface or interface does not strongly increase the linewidth of photoemission core-level peaks. The increase is smaller than the magnitude of the band bending, and in most cases negligible. Non-negligible increases are found only when the linewidth is smaller than and, simultaneously, the photoelectron escape depth larger than in a typical experiment." @default.
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- W2034009276 date "1993-04-15" @default.
- W2034009276 modified "2023-10-18" @default.
- W2034009276 title "Band bending at semiconductor interfaces and its effect on photoemission line shapes" @default.
- W2034009276 cites W1964921084 @default.
- W2034009276 doi "https://doi.org/10.1103/physrevb.47.9907" @default.
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