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- W2034168499 abstract "Abstract The sharpness of MeV ion microscope images is governed by small-angle scattering and associated lateral spreading of the ion beam in the sample. We have investigated measurement of the half-angle of the angular spreading distribution by characterising the image blurring in direct-Scanning Transmission Ion Microscopy (direct-STIM). In these tests Mylar™ foils of 0.5–6 μm were used to induce angular spreading. Images were taken of an electron microscope grid using 2 MeV protons with, and without, the foils in the beam path. The blurring was measured by fitting the width of a circular Gaussian point spread function to the images with and without the foil in position. The results show the half-angle width of the spreading has a square root dependence on foil thickness that lies intermediate between SRIM predictions and the theoretical estimates (Bird and Williams fits to the Sigmund and Winterbon data and Amsel et al.)." @default.
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- W2034168499 date "2013-07-01" @default.
- W2034168499 modified "2023-09-30" @default.
- W2034168499 title "Angular spreading measurements using MeV ion microscopes" @default.
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- W2034168499 doi "https://doi.org/10.1016/j.nimb.2012.11.035" @default.
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