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• W2034181624 abstract "Tuning of the energetic barriers to charge transfer at the semiconductor/dielectric interface in organic field-effect transistors (OFETs) is achieved by varying the dielectric functionality. Based on this, the correlation between the magnitude of the energy barrier and the gate-bias stress stability of the OFETs is demonstrated, and the origin of the excellent device stability of OFETs employing fluorinated dielectrics is revealed." @default.
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• W2034181624 date "2014-11-12" @default.
• W2034181624 modified "2023-10-16" @default.
• W2034181624 title "The origin of excellent gate-bias stress stability in organic field-effect transistors employing fluorinated-polymer gate dielectrics." @default.
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• W2034181624 doi "https://doi.org/10.1002/adma.201402363" @default.
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