Matches in SemOpenAlex for { <https://semopenalex.org/work/W2034184594> ?p ?o ?g. }
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- W2034184594 endingPage "342" @default.
- W2034184594 startingPage "329" @default.
- W2034184594 abstract "Electronic systems malfunctions are increasingly being attributed to electrostatic discharge effects. Owing to the growing deployment of sensitive data-processing machines in ‘static’ prone environments, such effects are creating a reputation for unreliability. The discharge of static electricity near active electronic systems can cause memory corruption or temporary failure owing to device latch-up, usually recoverable on re-start. At the device level, however, electrostatic discharges may result in total destruction. The mechanisms of such failure are discussed. Typical practical problems which arise in electronics production, test and packaging are described, combative means presented and areas of uncertainly reviewed." @default.
- W2034184594 created "2016-06-24" @default.
- W2034184594 creator A5011964984 @default.
- W2034184594 date "1985-05-01" @default.
- W2034184594 modified "2023-09-27" @default.
- W2034184594 title "Harmful effects and damage to electronics by electrostatic discharges" @default.
- W2034184594 cites W2037397586 @default.
- W2034184594 cites W2044400375 @default.
- W2034184594 cites W2137421786 @default.
- W2034184594 doi "https://doi.org/10.1016/0304-3886(85)90055-5" @default.
- W2034184594 hasPublicationYear "1985" @default.
- W2034184594 type Work @default.
- W2034184594 sameAs 2034184594 @default.
- W2034184594 citedByCount "15" @default.
- W2034184594 countsByYear W20341845942014 @default.
- W2034184594 countsByYear W20341845942018 @default.
- W2034184594 countsByYear W20341845942020 @default.
- W2034184594 countsByYear W20341845942022 @default.
- W2034184594 crossrefType "journal-article" @default.
- W2034184594 hasAuthorship W2034184594A5011964984 @default.
- W2034184594 hasConcept C105339364 @default.
- W2034184594 hasConcept C115903868 @default.
- W2034184594 hasConcept C119599485 @default.
- W2034184594 hasConcept C127413603 @default.
- W2034184594 hasConcept C138331895 @default.
- W2034184594 hasConcept C165801399 @default.
- W2034184594 hasConcept C171146098 @default.
- W2034184594 hasConcept C200601418 @default.
- W2034184594 hasConcept C205483674 @default.
- W2034184594 hasConcept C206658404 @default.
- W2034184594 hasConcept C2989044035 @default.
- W2034184594 hasConceptScore W2034184594C105339364 @default.
- W2034184594 hasConceptScore W2034184594C115903868 @default.
- W2034184594 hasConceptScore W2034184594C119599485 @default.
- W2034184594 hasConceptScore W2034184594C127413603 @default.
- W2034184594 hasConceptScore W2034184594C138331895 @default.
- W2034184594 hasConceptScore W2034184594C165801399 @default.
- W2034184594 hasConceptScore W2034184594C171146098 @default.
- W2034184594 hasConceptScore W2034184594C200601418 @default.
- W2034184594 hasConceptScore W2034184594C205483674 @default.
- W2034184594 hasConceptScore W2034184594C206658404 @default.
- W2034184594 hasConceptScore W2034184594C2989044035 @default.
- W2034184594 hasIssue "2-3" @default.
- W2034184594 hasLocation W20341845941 @default.
- W2034184594 hasOpenAccess W2034184594 @default.
- W2034184594 hasPrimaryLocation W20341845941 @default.
- W2034184594 hasRelatedWork W1500237930 @default.
- W2034184594 hasRelatedWork W2051797433 @default.
- W2034184594 hasRelatedWork W2072860448 @default.
- W2034184594 hasRelatedWork W2127436184 @default.
- W2034184594 hasRelatedWork W2347737742 @default.
- W2034184594 hasRelatedWork W2347842985 @default.
- W2034184594 hasRelatedWork W2357874235 @default.
- W2034184594 hasRelatedWork W2388429149 @default.
- W2034184594 hasRelatedWork W252109270 @default.
- W2034184594 hasRelatedWork W573780513 @default.
- W2034184594 hasVolume "16" @default.
- W2034184594 isParatext "false" @default.
- W2034184594 isRetracted "false" @default.
- W2034184594 magId "2034184594" @default.
- W2034184594 workType "article" @default.