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- W2034233452 abstract "Numerical calculations describing the influence of the interference of internally-reflected radiation on the photoelectromagnetic (PEM) effect in graded energy-gap CdxHg1−xTe structures are presented. The spectral voltage responsivities of graded-gap IR-PEM detectors are reported as functions of the semiconductor structure thickness, composition profile of the structure, doping level, surface recombination velocity and reflection coefficient from the structure substrate. The thickness of graded-gap PEM detectors is one of the more important parameters which can affect their performance." @default.
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- W2034233452 date "1984-07-01" @default.
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- W2034233452 title "Interference photoelectromagnetic effect in graded-gap semiconductors" @default.
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- W2034233452 doi "https://doi.org/10.1016/0020-0891(84)90028-9" @default.
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