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- W2034278122 abstract "Conventional surface-characterization techniques either are not sophisticated enough to provide complete surface-topographical data or cannot be employed because of the relatively low hardness of magnetic media. An optical profilometer has been developed which provides a noncontact method of obtaining surface characteristics from a magnetic medium. The system consists of a standard Leitz reflection microscope, a Mirau interferometer controlled by a piezoelectric transducer, a linear array of photodiode detectors, and a microcomputer. The combination yields a system that measures the optical-height variations of surfaces to a high degree of precision. This height variation is processed by a computer to provide surface-topographical statistical parameters, which are useful to predict tribological and magnetic performances of the head-media interface. Sample data of magnetic media (tape, floppy disk, and rigid disk) are presented." @default.
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- W2034278122 date "1984-01-01" @default.
- W2034278122 modified "2023-10-05" @default.
- W2034278122 title "An Optical Profilometer for Surface Characterization of Magnetic Media" @default.
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- W2034278122 doi "https://doi.org/10.1080/05698198408981550" @default.
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