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- W2034278873 abstract "We report on a measurement of craters in thin dielectric films formed by Xe(Q+) (26 ≤ Q ≤ 44) projectiles. Tunnel junction devices with ion-irradiated barriers were used to amplify the effect of charge-dependent cratering through the exponential dependence of tunneling conductance on barrier thickness. Electrical conductance of a crater σ(c)(Q) increased by 4 orders of magnitude (7.9 × 10(-4) μS to 6.1 μS) as Q increased, corresponding to crater depths ranging from 2 to 11 Å. By employing a heated spike model, we determine that the energy required to produce the craters spans from 8 to 25 keV over the investigated charge states. Considering energy from preequilibrium nuclear and electronic stopping as well as neutralization, we find that at least (27 ± 2)% of available projectile neutralization energy is deposited into the thin film during impact." @default.
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- W2034278873 date "2011-08-05" @default.
- W2034278873 modified "2023-10-02" @default.
- W2034278873 title "Charge State Dependent Energy Deposition by Ion Impact" @default.
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- W2034278873 doi "https://doi.org/10.1103/physrevlett.107.063202" @default.
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