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- W2034894619 abstract "This paper aims at developing a novel defect detection algorithm for the semiconductor assembly process by image analysis of a single captured image, without reference to another image during inspection. The integrated circuit (IC) pattern is usually periodic and regular. Therefore, we can implement a classification scheme whereby the regular pattern in the die image is classified as the acceptable circuit pattern and the die defect can be modeled as irregularity on the image. The detection of irregularity in image is thus equivalent to the detection of die defect. We propose a method where the defect detection algorithm first segments the die image into different regions according to the circuit pattern by a set of morphological segmentations with different structuring element sizes. Then, a feature vector, which consists of many image attributes, is calculated for each segmented region. Lastly, the defective region is extracted by the feature vector classification." @default.
- W2034894619 created "2016-06-24" @default.
- W2034894619 creator A5008832723 @default.
- W2034894619 creator A5037279553 @default.
- W2034894619 creator A5038049072 @default.
- W2034894619 creator A5053871914 @default.
- W2034894619 creator A5081075085 @default.
- W2034894619 date "2005-02-24" @default.
- W2034894619 modified "2023-09-26" @default.
- W2034894619 title "Reference-free detection of semiconductor assembly defect" @default.
- W2034894619 cites W1515315241 @default.
- W2034894619 cites W1557824094 @default.
- W2034894619 cites W1561442812 @default.
- W2034894619 cites W1806471916 @default.
- W2034894619 cites W1983651745 @default.
- W2034894619 cites W1996842552 @default.
- W2034894619 cites W2139038335 @default.
- W2034894619 cites W2141616298 @default.
- W2034894619 cites W2144334573 @default.
- W2034894619 cites W2145023731 @default.
- W2034894619 cites W2322002063 @default.
- W2034894619 cites W2911551465 @default.
- W2034894619 doi "https://doi.org/10.1117/12.584883" @default.
- W2034894619 hasPublicationYear "2005" @default.
- W2034894619 type Work @default.
- W2034894619 sameAs 2034894619 @default.
- W2034894619 citedByCount "2" @default.
- W2034894619 countsByYear W20348946192014 @default.
- W2034894619 crossrefType "proceedings-article" @default.
- W2034894619 hasAuthorship W2034894619A5008832723 @default.
- W2034894619 hasAuthorship W2034894619A5037279553 @default.
- W2034894619 hasAuthorship W2034894619A5038049072 @default.
- W2034894619 hasAuthorship W2034894619A5053871914 @default.
- W2034894619 hasAuthorship W2034894619A5081075085 @default.
- W2034894619 hasBestOaLocation W20348946192 @default.
- W2034894619 hasConcept C111919701 @default.
- W2034894619 hasConcept C115961682 @default.
- W2034894619 hasConcept C124504099 @default.
- W2034894619 hasConcept C126422989 @default.
- W2034894619 hasConcept C138885662 @default.
- W2034894619 hasConcept C153180895 @default.
- W2034894619 hasConcept C154945302 @default.
- W2034894619 hasConcept C177264268 @default.
- W2034894619 hasConcept C199360897 @default.
- W2034894619 hasConcept C2776401178 @default.
- W2034894619 hasConcept C31972630 @default.
- W2034894619 hasConcept C41008148 @default.
- W2034894619 hasConcept C41895202 @default.
- W2034894619 hasConcept C52622490 @default.
- W2034894619 hasConcept C83665646 @default.
- W2034894619 hasConcept C9417928 @default.
- W2034894619 hasConcept C98045186 @default.
- W2034894619 hasConceptScore W2034894619C111919701 @default.
- W2034894619 hasConceptScore W2034894619C115961682 @default.
- W2034894619 hasConceptScore W2034894619C124504099 @default.
- W2034894619 hasConceptScore W2034894619C126422989 @default.
- W2034894619 hasConceptScore W2034894619C138885662 @default.
- W2034894619 hasConceptScore W2034894619C153180895 @default.
- W2034894619 hasConceptScore W2034894619C154945302 @default.
- W2034894619 hasConceptScore W2034894619C177264268 @default.
- W2034894619 hasConceptScore W2034894619C199360897 @default.
- W2034894619 hasConceptScore W2034894619C2776401178 @default.
- W2034894619 hasConceptScore W2034894619C31972630 @default.
- W2034894619 hasConceptScore W2034894619C41008148 @default.
- W2034894619 hasConceptScore W2034894619C41895202 @default.
- W2034894619 hasConceptScore W2034894619C52622490 @default.
- W2034894619 hasConceptScore W2034894619C83665646 @default.
- W2034894619 hasConceptScore W2034894619C9417928 @default.
- W2034894619 hasConceptScore W2034894619C98045186 @default.
- W2034894619 hasLocation W20348946191 @default.
- W2034894619 hasLocation W20348946192 @default.
- W2034894619 hasOpenAccess W2034894619 @default.
- W2034894619 hasPrimaryLocation W20348946191 @default.
- W2034894619 hasRelatedWork W1780126258 @default.
- W2034894619 hasRelatedWork W2041525275 @default.
- W2034894619 hasRelatedWork W2354804986 @default.
- W2034894619 hasRelatedWork W2382607599 @default.
- W2034894619 hasRelatedWork W2534909612 @default.
- W2034894619 hasRelatedWork W2904596878 @default.
- W2034894619 hasRelatedWork W3197541072 @default.
- W2034894619 hasRelatedWork W3214851576 @default.
- W2034894619 hasRelatedWork W4312753625 @default.
- W2034894619 hasRelatedWork W2106595108 @default.
- W2034894619 isParatext "false" @default.
- W2034894619 isRetracted "false" @default.
- W2034894619 magId "2034894619" @default.
- W2034894619 workType "article" @default.