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• W2035265105 endingPage "1754" @default.
• W2035265105 startingPage "1746" @default.
• W2035265105 abstract "We present a rigorous analysis of the effects of electric fields on time-resolved photoluminescence spectra in semiconductors. It is based on the solution of the semiconductor transport equations using the drift-diffusion approxmation. The results show that the effect of the field alone on the photoluminescence decay can be distinguished from that of charge separation and field-enhanced surface recombination. The analysis is applied to two different sets of experiments. In the first, we use femtosecond luminescence upconversion to observe the ultrafast charge separation in the space-charge region, and screening of the electric field under high-injection conditions. The second group of experiments was conducted on heterostructures of GaAs/${mathrm{Ga}}_{mathit{x}}$${mathrm{In}}_{1mathrm{ensuremath{-}}mathit{x}}$P under externally applied bias using time-correlated single-photon counting detection in the picosecond time domain. The use of the method for extracting charge-transfer velocities across semiconductor interfaces is discussed." @default.
• W2035265105 created "2016-06-24" @default.
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• W2035265105 date "1994-07-15" @default.
• W2035265105 modified "2023-09-25" @default.
• W2035265105 title "Photogenerated carrier dynamics under the influence of electric fields in III-V semiconductors" @default.
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• W2035265105 doi "https://doi.org/10.1103/physrevb.50.1746" @default.
• W2035265105 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/9976365" @default.
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