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- W2035508719 abstract "The correlated improvement in yield and reliability has been observed in the case studies on integrated circuits and electronic assemblies. This paper presents a model that incorporates yield and reliability with the addition of a burn-in step to explain their correlated improvement. The proposed model includes as special cases several yield and reliability models that have been previously published and thus provides a unifying framework. The model is used to derive a condition for which yield functions can be multiplied to obtain the overall yield. Yield and reliability are compared as a function of operation time, and an analytical condition for burn-in to be effective is also obtained. Finally, Poisson and negative binomial defects models are further considered to investigate how reliability is based on yield. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004." @default.
- W2035508719 created "2016-06-24" @default.
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- W2035508719 date "2004-08-01" @default.
- W2035508719 modified "2023-10-16" @default.
- W2035508719 title "A unified model incorporating yield, burn-in, and reliability" @default.
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- W2035508719 doi "https://doi.org/10.1002/nav.20023" @default.
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