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• W2035584621 abstract "The electrical (DC) behavior of single silicon microwires has been determined by the use of tungsten probes to make ohmic contact to the silicon microwires. The basic electrical properties of the microwires, such as their DC resistivity and the doping distribution along the length of the microwires, were investigated using this approach. The technique was also used to characterize the junction between silicon microwires and conducting polymers to assess the suitability of such contacts for use in a proposed artificial photosynthesis system." @default.
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• W2035584621 date "2011-03-04" @default.
• W2035584621 modified "2023-10-18" @default.
• W2035584621 title "Electrical Characterization of Si Microwires and of Si Microwire/Conducting Polymer Composite Junctions" @default.
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• W2035584621 doi "https://doi.org/10.1021/jz2001375" @default.
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