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• W2036795512 abstract "ABSTRACT Epitaxially grown GaN by metal organic chemical vapor deposition (MOCVD) on SiC were implanted with 100 keV Si + (for n-type) and 80 keV Mg + (for p-type) with various fluences from 1×10 12 to 7×10 15 ions/cm 2 at liquid nitrogen temperature (LT), room temperature (RT), and 700 °C (HT). High temperature (1200 °C and 1500 °C) annealing was carried out after capping the GaN with epitaxial AIN by MOCVD to study damage recovery. Samples were capped by a layer of AIN in order to protect the GaN surface during annealing. Effects of implant temperature, damage and dopant activation are critically studied to evaluate a role of ion implantation in doping of GaN. The damage was studied by Rutherford Backscattering/Channeling, spectroscopic ellipsometry and photoluminescence. Results show dependence of radiation damage level on temperature of the substrate during implantation: implantations at elevated temperatures up to 550 °C decrease the lattice disorder; “hot implants” above 550 °C can not be useful in doping of GaN due to nitrogen loss from the surface. SE measurements have indicated very high sensitivity to the implantation damage. PL measurements at LT of 80 keV Mg + (5×10 14 cm -2 ) implanted and annealed GaN showed two peaks : one ∼100 meV and another ∼140 meV away from the band edge." @default.
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• W2036795512 date "1998-01-01" @default.
• W2036795512 modified "2023-09-27" @default.
• W2036795512 title "Doping of GaN by Ion Implantation: Does it Work?" @default.
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• W2036795512 doi "https://doi.org/10.1557/proc-512-475" @default.
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