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- W2037483885 abstract "AgInSbTe (AIST)–SiO2 nanocomposite thin films were successfully prepared by sputtering deposition utilizing an AIST–SiO2 composite target and their phase-transition behaviors were investigated. Transmission electron microscopy (TEM) revealed that the as-deposited composite layer contained nano-scale quaternary alloy particles about 5 nm in size randomly embedded in the SiO2 matrix. In situ reflectivity–temperature measurements showed that the AIST–SiO2 nanocomposite and pristine AIST layers exhibit similar abrupt reflectivity changes at about 200 °C. However, the presence of the SiO2 phase hindered particle growth in the nanocomposite layers which, in turn, caused a mild increase in the phase-transition temperatures. Johnson–Mehl–Avrami (JMA) analysis indicated that, regardless of the film thickness, the amorphous-to-crystalline transition in nanocomposite layers proceeds in a bulk-like manner. Dynamic tests revealed that modulations higher than 0.8, 0.6, and 0.5 were achieved when 11T, 4T, and 3T signals, respectively were, written in the one-layer AIST–SiO2 disk sample. The unique phase transition behavior of nanocomposite layers and signal property analysis of disk samples demonstrated that a nanocomposite layer can be a new alternative for write-once optical data storage." @default.
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- W2037483885 date "2008-07-18" @default.
- W2037483885 modified "2023-09-25" @default.
- W2037483885 title "Phase Transition Kinetics and Recording Characteristics of Nanocomposite Layers Prepared by Sputtering Process Utilizing AgInSbTe–SiO<sub>2</sub>Composite Target" @default.
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- W2037483885 doi "https://doi.org/10.1143/jjap.47.6029" @default.
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