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• W2037538426 startingPage "3270" @default.
• W2037538426 abstract "Compton profiles of silicon along the [100] and [110] axes have been measured with a recently developed spectrometer having a momentum resolution of 0.084 atomic units. The following subjects are discussed using the observed profiles: (1) valence electron profiles, (2) directional anisotropy of the profile, (3) comparison with the angular correlation of positron-annihilation radiation, (4) evaluation of the Lock-Crisp-West theory, and (5) the auto correlation function. The high resolution in momentum makes it possible to evaluate theoretical calculations precisely. It is shown that the theoretical calculation based on the tight binding model describes the momentum distribution of silicon fairly well." @default.
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• W2037538426 date "1989-09-15" @default.
• W2037538426 modified "2023-09-26" @default.
• W2037538426 title "High-Resolution Compton Profile of Si Using 29.5 keV Synchrotron-Radiation X-Rays" @default.
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• W2037538426 doi "https://doi.org/10.1143/jpsj.58.3270" @default.
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