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- W2039544207 abstract "Recently, broad-area InGaAs-AlGaAs strained quantum well (QW) lasers have attracted much attention because oftheir unparalleled high optical output power characteristics that narrow stripe lasers or tapered lasers can notachieve. However, broad-area lasers suffer from poor beam quality and their high reliability operation has not beenproven for communications applications. This paper concerns reliability and degradation aspects of broad-arealasers. Good facet passivation techniques along with optimized structural designs have led to successfuldemonstration of reliable 980nm single-mode lasers, and the dominant failure mode of both single-mode and broadarealasers is catastrophic optical mirror damage (COMD), which limits maximum output powers and alsodetermines operating output powers. Although broad-area lasers have shown characteristics unseen from singlemodelasers including filamentation, their effects on long-term reliability and degradation processes have not beenfully investigated. Filamentation can lead to instantaneous increase in optical power density and thus temperaturerise at localized areas through spatial-hole burning and thermal lensing which significantly reduces filament sizesunder high power operation, enhancing the COMD process. We investigated degradation processes in commercialMOCVD-grown broad-area InGaAs-AlGaAs strained QW lasers at ~975nm with and without passivation layers byperforming accelerated lifetests of these devices followed by failure mode analyses with various micro-analyticaltechniques. Since instantaneous fluctuations of filaments can lead to faster wear-out of passivation layer thus leadingto facet degradation, both passivated and unpassivated broad-area lasers were studied that yielded catastrophicfailures at the front facet and also in the bulk. Electron beam induced current technique was employed to study darkline defects (DLDs) generated in degraded lasers stressed under different test conditions and focused ion beam wasemployed to prepare TEM samples from the DLD areas for HR-TEM analysis. We report our in-depth failure modeanalysis results." @default.
- W2039544207 created "2016-06-24" @default.
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- W2039544207 date "2009-02-12" @default.
- W2039544207 modified "2023-10-05" @default.
- W2039544207 title "Degradation processes in high power multi-mode InGaAs strained quantum well lasers" @default.
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- W2039544207 doi "https://doi.org/10.1117/12.814661" @default.
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