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- W2039787298 abstract "Abstract The degradation of p - n - p silicon BJTs under dynamic high-current stress has been studied. The BJTs were biased in the forward active mode with collector open or shorted to the base, and in the inverse active mode with emitter open or shorted to the base, the bias voltages were varied. During stress, the phenomena of reduction and recovery in base current have been found. When the BJT was biased in the inverse active mode, after the stress was terminated, the base current continued to increase with measurement time. This post-stress degradation takes several hours to reach a saturation value. Possible physical mechanisms have been proposed to interpret the experimental findings in this work." @default.
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- W2039787298 date "1995-07-01" @default.
- W2039787298 modified "2023-10-07" @default.
- W2039787298 title "Dynamic high-current stressing damage and post-stress relaxation in p-n-p silicon bipolar junction transistors" @default.
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- W2039787298 doi "https://doi.org/10.1016/0038-1101(94)00246-c" @default.
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