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• W2040222718 abstract "Abstract The electronic properties of ZnO surfaces and interfaces has until recently been relatively unexplored. We have used a complement of ultrahigh vacuum scanning electron microscope (SEM)-based, depth-resolved cathodoluminescence spectroscopy (DRCLS), temperature-dependent charge transport, trap spectroscopy, and surface science techniques to probe the electronic and chemical properties of clean surfaces and interfaces on a nanometer scale. DRCLS reveals remarkable nanoscale correlations of native point defect distributions with surface and sub-surface defects calibrated with capacitance trap spectroscopies, atomic force microscopy, and Kelvin probe force microscopy. The measurement of these near-surface states associated with native point defects in the ZnO bulk and those induced by interface chemical bonding is a powerful extension of cathodoluminescence spectroscopy that provides a guide to understanding and controlling ZnO electronic contacts." @default.
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• W2040222718 date "2009-04-01" @default.
• W2040222718 modified "2023-10-16" @default.
• W2040222718 title "Nanoscale depth-resolved cathodoluminescence spectroscopy of ZnO surfaces and metal interfaces" @default.
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• W2040222718 doi "https://doi.org/10.1016/j.spmi.2008.11.008" @default.
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