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- W2040387554 abstract "Reflection high-energy electron diffraction (RHEED) is the standard analytical tool of most molecular beam epitaxy (MBE) systems. A detailed analysis of RHEED patterns and oscillations can provide much more information about how growth proceeds than routinely exploited. Processes that take place during growth interruptions, the occurrence of a phenomenon denoted as ‘material contrast’, which has so far only been reported for II–VI materials, and a detailed analysis of the phase angle of RHEED oscillations are covered." @default.
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- W2040387554 title "Investigations on the growth mechanism of wide-gap II–VI semiconductors by means of reflection high energy electron diffraction" @default.
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