FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2040475093> ?p ?o ?g. }

• W2040475093 endingPage "F743" @default.
• W2040475093 startingPage "F734" @default.
• W2040475093 abstract "Sulfur impurities in carbon containing fuels for solid oxide fuel cells (SOFC), e.g. natural gas and biogas, typically lead to significant losses in performance due to the sulfur sensitivity of Ni/yttria-stabilized-zirconia (YSZ) anodes for SOFC. Full cells having Ni/YSZ anodes have been characterized during long-term galvanostatic operation in internal reforming gas mixture (CH4/H2O/H2:30/60/10), with 2 ppm H2S exposure to the anode for 500 hours at 850°C, at different current densities. This work focus on the long-term effect of H2S exposure over a few hundreds of hours; and describes and correlates the observed evolution of anode performance, over hundreds of hours, with sulfur exposure at low cell overpotential (low current density) and at high overpotential (high current density) with and without H2S exposure. For tests at low overpotential with H2S exposure only a reversible loss in performance was observed and post-mortem SEM analysis showed an intact Ni/YSZ anode microstructure. For tests at high cell overpotential the H2S exposure caused both a reversible loss in performance and an irreversible long-term degradation. Post-mortem SEM analysis of the Ni/YSZ anode from this tests showed increased porosity and lack of percolating Ni in the few microns of the anode closest to the anode/electrolyte interface." @default.
• W2040475093 created "2016-06-24" @default.
• W2040475093 creator A5004315101 @default.
• W2040475093 creator A5074226300 @default.
• W2040475093 creator A5081474380 @default.
• W2040475093 creator A5088898864 @default.
• W2040475093 date "2014-01-01" @default.
• W2040475093 modified "2023-10-15" @default.
• W2040475093 title "Sulfur Poisoning of SOFC Anodes: Effect of Overpotential on Long-Term Degradation" @default.
• W2040475093 cites W1555503975 @default.
• W2040475093 cites W1793338820 @default.
• W2040475093 cites W1971245150 @default.
• W2040475093 cites W1971656165 @default.
• W2040475093 cites W1978483944 @default.
• W2040475093 cites W1979452781 @default.
• W2040475093 cites W1982257907 @default.
• W2040475093 cites W1982769732 @default.
• W2040475093 cites W1983715336 @default.
• W2040475093 cites W1985465565 @default.
• W2040475093 cites W1986564234 @default.
• W2040475093 cites W1991601192 @default.
• W2040475093 cites W1992853515 @default.
• W2040475093 cites W1995167827 @default.
• W2040475093 cites W1995639945 @default.
• W2040475093 cites W1997372761 @default.
• W2040475093 cites W1999724380 @default.
• W2040475093 cites W1999798478 @default.
• W2040475093 cites W2004634478 @default.
• W2040475093 cites W2019997790 @default.
• W2040475093 cites W2021883739 @default.
• W2040475093 cites W2025283239 @default.
• W2040475093 cites W2030429488 @default.
• W2040475093 cites W2032516975 @default.
• W2040475093 cites W2035400866 @default.
• W2040475093 cites W2044239669 @default.
• W2040475093 cites W2045415499 @default.
• W2040475093 cites W2049528472 @default.
• W2040475093 cites W2054370328 @default.
• W2040475093 cites W2061955829 @default.
• W2040475093 cites W2082859743 @default.
• W2040475093 cites W2082865910 @default.
• W2040475093 cites W2086520091 @default.
• W2040475093 cites W2087017892 @default.
• W2040475093 cites W2095562611 @default.
• W2040475093 cites W2101543509 @default.
• W2040475093 cites W2106490553 @default.
• W2040475093 cites W2114703237 @default.
• W2040475093 cites W2124465392 @default.
• W2040475093 cites W2142591817 @default.
• W2040475093 cites W2171236183 @default.
• W2040475093 cites W2319161856 @default.
• W2040475093 cites W2321546043 @default.
• W2040475093 cites W2322430338 @default.
• W2040475093 cites W2598819239 @default.
• W2040475093 cites W2612313047 @default.
• W2040475093 doi "https://doi.org/10.1149/2.080406jes" @default.
• W2040475093 hasPublicationYear "2014" @default.
• W2040475093 type Work @default.
• W2040475093 sameAs 2040475093 @default.
• W2040475093 citedByCount "83" @default.
• W2040475093 countsByYear W20404750932014 @default.
• W2040475093 countsByYear W20404750932015 @default.
• W2040475093 countsByYear W20404750932016 @default.
• W2040475093 countsByYear W20404750932017 @default.
• W2040475093 countsByYear W20404750932018 @default.
• W2040475093 countsByYear W20404750932019 @default.
• W2040475093 countsByYear W20404750932020 @default.
• W2040475093 countsByYear W20404750932021 @default.
• W2040475093 countsByYear W20404750932022 @default.
• W2040475093 countsByYear W20404750932023 @default.
• W2040475093 crossrefType "journal-article" @default.
• W2040475093 hasAuthorship W2040475093A5004315101 @default.
• W2040475093 hasAuthorship W2040475093A5074226300 @default.
• W2040475093 hasAuthorship W2040475093A5081474380 @default.
• W2040475093 hasAuthorship W2040475093A5088898864 @default.
• W2040475093 hasBestOaLocation W20404750931 @default.
• W2040475093 hasConcept C123609680 @default.
• W2040475093 hasConcept C127413603 @default.
• W2040475093 hasConcept C134132462 @default.
• W2040475093 hasConcept C147789679 @default.
• W2040475093 hasConcept C17525397 @default.
• W2040475093 hasConcept C185592680 @default.
• W2040475093 hasConcept C186460083 @default.
• W2040475093 hasConcept C191897082 @default.
• W2040475093 hasConcept C192562407 @default.
• W2040475093 hasConcept C2778456004 @default.
• W2040475093 hasConcept C42360764 @default.
• W2040475093 hasConcept C518881349 @default.
• W2040475093 hasConcept C52859227 @default.
• W2040475093 hasConcept C68801617 @default.
• W2040475093 hasConcept C89395315 @default.
• W2040475093 hasConcept C96410337 @default.
• W2040475093 hasConceptScore W2040475093C123609680 @default.
• W2040475093 hasConceptScore W2040475093C127413603 @default.
• W2040475093 hasConceptScore W2040475093C134132462 @default.
• W2040475093 hasConceptScore W2040475093C147789679 @default.
• W2040475093 hasConceptScore W2040475093C17525397 @default.
• W2040475093 hasConceptScore W2040475093C185592680 @default.

• next