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- W2040561637 abstract "Electrical and etch-pit studies have been carried out on integrated NPN transistor arrays. In one array the devices had extensive ‘kinks’ in their IC-VBE curves. One device in this array also exhibited peculiar burst-noise behaviour. The anomalous I-V and burst noise behaviour has been attributed to the presence of surface channels between all three contacts plus a dislocation network in the base region." @default.
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- W2040561637 date "1980-07-01" @default.
- W2040561637 modified "2023-10-18" @default.
- W2040561637 title "Anomalous I-V and burst noise characteristics associated with surface channels in an NPN integrated transistor" @default.
- W2040561637 cites W2047350726 @default.
- W2040561637 doi "https://doi.org/10.1016/0038-1101(80)90129-x" @default.
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