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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2040773997> ?p ?o ?g. }

• W2040773997 endingPage "50" @default.
• W2040773997 startingPage "33" @default.
• W2040773997 abstract "This paper summarizes recently published data on CMOS integrated circuit failure rates, and provides information on the effects of voltage, temperature, device complexity, and packaging on CMOS failure rates. Other factors which can affect failure rate are also indicated, including designs, materials, processes, in-process controls, screening tests, and product maturity. Data on failure rates of NMOS and PMOS integrated circuits are provided to enable comparison with CMOS data. It is concluded that available data do not indicate any consistent reliability difference for CMOS versus NMOS or PMOS integrated circuits. Because of the many advantages of CMOS integrated circuit technology, continued increase in usage of CMOS circuits has been forecast, accompanied by further increases in CMOS integrated circuit reliability." @default.
• W2040773997 created "2016-06-24" @default.
• W2040773997 creator A5021555203 @default.
• W2040773997 creator A5091361722 @default.
• W2040773997 date "1981-01-01" @default.
• W2040773997 modified "2023-10-18" @default.
• W2040773997 title "CMOS integrated circuit reliability" @default.
• W2040773997 cites W1964219427 @default.
• W2040773997 cites W1968175716 @default.
• W2040773997 cites W1976621533 @default.
• W2040773997 cites W1977589656 @default.
• W2040773997 cites W1986803187 @default.
• W2040773997 cites W1991189272 @default.
• W2040773997 cites W1994078603 @default.
• W2040773997 cites W2013343652 @default.
• W2040773997 cites W2024380513 @default.
• W2040773997 cites W2025837084 @default.
• W2040773997 cites W2027819480 @default.
• W2040773997 cites W2047200336 @default.
• W2040773997 cites W2047228503 @default.
• W2040773997 cites W2048011546 @default.
• W2040773997 cites W2060892506 @default.
• W2040773997 cites W2061619644 @default.
• W2040773997 cites W2064138787 @default.
• W2040773997 cites W2065819023 @default.
• W2040773997 cites W2072640068 @default.
• W2040773997 cites W2074673023 @default.
• W2040773997 cites W2091389499 @default.
• W2040773997 cites W2104251856 @default.
• W2040773997 cites W2135304237 @default.
• W2040773997 cites W2173944053 @default.
• W2040773997 cites W4252170306 @default.
• W2040773997 cites W2022815659 @default.
• W2040773997 doi "https://doi.org/10.1016/0026-2714(81)90544-8" @default.
• W2040773997 hasPublicationYear "1981" @default.
• W2040773997 type Work @default.
• W2040773997 sameAs 2040773997 @default.
• W2040773997 citedByCount "8" @default.
• W2040773997 countsByYear W20407739972012 @default.
• W2040773997 crossrefType "journal-article" @default.
• W2040773997 hasAuthorship W2040773997A5021555203 @default.
• W2040773997 hasAuthorship W2040773997A5091361722 @default.
• W2040773997 hasConcept C119599485 @default.
• W2040773997 hasConcept C121332964 @default.
• W2040773997 hasConcept C127413603 @default.
• W2040773997 hasConcept C134146338 @default.
• W2040773997 hasConcept C159903706 @default.
• W2040773997 hasConcept C163164238 @default.
• W2040773997 hasConcept C163258240 @default.
• W2040773997 hasConcept C165801399 @default.
• W2040773997 hasConcept C172385210 @default.
• W2040773997 hasConcept C197162436 @default.
• W2040773997 hasConcept C198521697 @default.
• W2040773997 hasConcept C200601418 @default.
• W2040773997 hasConcept C24326235 @default.
• W2040773997 hasConcept C27050352 @default.
• W2040773997 hasConcept C2778309119 @default.
• W2040773997 hasConcept C41008148 @default.
• W2040773997 hasConcept C43214815 @default.
• W2040773997 hasConcept C46362747 @default.
• W2040773997 hasConcept C530198007 @default.
• W2040773997 hasConcept C62520636 @default.
• W2040773997 hasConcept C81843906 @default.
• W2040773997 hasConceptScore W2040773997C119599485 @default.
• W2040773997 hasConceptScore W2040773997C121332964 @default.
• W2040773997 hasConceptScore W2040773997C127413603 @default.
• W2040773997 hasConceptScore W2040773997C134146338 @default.
• W2040773997 hasConceptScore W2040773997C159903706 @default.
• W2040773997 hasConceptScore W2040773997C163164238 @default.
• W2040773997 hasConceptScore W2040773997C163258240 @default.
• W2040773997 hasConceptScore W2040773997C165801399 @default.
• W2040773997 hasConceptScore W2040773997C172385210 @default.
• W2040773997 hasConceptScore W2040773997C197162436 @default.
• W2040773997 hasConceptScore W2040773997C198521697 @default.
• W2040773997 hasConceptScore W2040773997C200601418 @default.
• W2040773997 hasConceptScore W2040773997C24326235 @default.
• W2040773997 hasConceptScore W2040773997C27050352 @default.
• W2040773997 hasConceptScore W2040773997C2778309119 @default.
• W2040773997 hasConceptScore W2040773997C41008148 @default.
• W2040773997 hasConceptScore W2040773997C43214815 @default.
• W2040773997 hasConceptScore W2040773997C46362747 @default.
• W2040773997 hasConceptScore W2040773997C530198007 @default.
• W2040773997 hasConceptScore W2040773997C62520636 @default.
• W2040773997 hasConceptScore W2040773997C81843906 @default.
• W2040773997 hasIssue "1" @default.
• W2040773997 hasLocation W20407739971 @default.
• W2040773997 hasOpenAccess W2040773997 @default.
• W2040773997 hasPrimaryLocation W20407739971 @default.
• W2040773997 hasRelatedWork W1775886837 @default.
• W2040773997 hasRelatedWork W1985921646 @default.
• W2040773997 hasRelatedWork W2040773997 @default.
• W2040773997 hasRelatedWork W2142481737 @default.
• W2040773997 hasRelatedWork W2143500360 @default.
• W2040773997 hasRelatedWork W2152562936 @default.
• W2040773997 hasRelatedWork W2156460160 @default.
• W2040773997 hasRelatedWork W2164005033 @default.
• W2040773997 hasRelatedWork W2180089987 @default.
• W2040773997 hasRelatedWork W218847287 @default.

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