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• W2040890919 startingPage "171" @default.
• W2040890919 abstract "We have measured the parallel critical magnetic field ${H}_{censuremath{parallel}}$ of 4-nm-thick Al films. The conductance $frac{mathrm{dI}}{mathrm{dV}}$ of tunnel junctions made on these films was used to obtain for each film the orbital depairing parameter $ensuremath{zeta}$ and spin-orbit scattering parameter $b$ which were then used in the theory of high-field superconductivity to calculate ${H}_{censuremath{parallel}}$. Comparison of the calculated and measured values shows the theory in its traditional form to be quantitatively lacking. When renormalization effects due to the electron-phonon interaction are included, the theory with no adjustable parameters gives a good description of ${H}_{censuremath{parallel}}$ for the Al films. However, if the Al is coated with submonolayer thickness of heavy metal to increase $b$, the theory does not reproduce the measured ${H}_{censuremath{parallel}}$ as well." @default.
• W2040890919 created "2016-06-24" @default.
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• W2040890919 date "1982-01-01" @default.
• W2040890919 modified "2023-10-02" @default.
• W2040890919 title "Critical magnetic field of very thin superconducting aluminum films" @default.
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• W2040890919 doi "https://doi.org/10.1103/physrevb.25.171" @default.
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