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• W2041736166 abstract "K and L line calibration has been performed for a PIXE setup by the independent use of experimental and theoretical methods. In the former case, thin film standards of known thicknesses were applied, while in the latter one cross section values were derived from different theoretical models. Programs REV5S and PIXEKL developed here were used for spectrum evaluation and concentration determination, respectively. They proved to be reliable and especially appropriate for routine serial evaluation of spectra measured on samples of nearly identical matrices. As a result of the work, an accurate calibration of the setup has been obtained and it was shown that experimental and theoretical techniques used lead to calibration curves which fit each other reasonably well." @default.
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• W2041736166 date "1985-12-01" @default.
• W2041736166 modified "2023-10-18" @default.
• W2041736166 title "Experimental and theoretical calibration of a PIXE setup for K and L X-rays" @default.
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• W2041736166 doi "https://doi.org/10.1016/0168-583x(85)90506-3" @default.
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