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- W2041987945 abstract "The electron transport in single-gate and double-gate silicon-on-insulator devices is studied as a function of the transverse electric field and the silicon layer thickness, with particular attention to the evaluation of stationary drift velocity and low-field mobility at room temperature." @default.
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- W2041987945 date "2001-04-01" @default.
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- W2041987945 title "Electron transport in silicon-on-insulator devices" @default.
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- W2041987945 doi "https://doi.org/10.1016/s0038-1101(01)00076-4" @default.
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