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- W2041994209 abstract "The analytical electron microscope (AEM) can be used to obtain quantitative elemental analysis with a spatial resolution of <10 nm, and a detectability limit of <∼0.1 wt%. Equilibrium (Gibbsian) segregation usually occurs on a lateral scale of <1 nm but with large composition changes (often up to ≈ 100%). Therefore, this phenomenon is detectable in the AEM, but its spatial localization is not explicitly definable. Non-equilibrium segregation occurs on a lateral scale from ≈ 1 nm to > 1μm with accompanying composition changes of <∼1–5 wt%. Therefore this typeof segregation is ideally suited to AEM studies which can easily detect both the spatial extent of the segregation and the associated compositional changes. This paper reviews the current capabilities of the EAM when applied to problems of interfacial segregation. Strong emphasis is placed on the role of deconvolution techniques to extract the most information from the composition profiles." @default.
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- W2041994209 title "Studies of interfacial segregation in the analytical electron microscope: A brief review" @default.
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- W2041994209 doi "https://doi.org/10.1016/0304-3991(89)90171-x" @default.
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