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• W2042750414 abstract "We report the observation of a new type of intrinsic defect in n-In0.5Ga0.5P which can be generated by recombination enhanced defect reaction (REDR) mechanism. It is observed that the increases of the concentrations of this defect and of another native defect due to REDR have nearly linear time dependence before saturation. This observation and other experimental results suggest that the two observed defects are complex defects. Other electrical properties of these defects such as alloy broadening effect on the thermal ionization energy are also described." @default.
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• W2042750414 date "1993-09-06" @default.
• W2042750414 modified "2023-10-15" @default.
• W2042750414 title "Characteristics of electron traps in In0.5Ga0.5P generated by recombination enhanced defect reactions" @default.
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• W2042750414 doi "https://doi.org/10.1063/1.109678" @default.
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