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- W2043559114 abstract "SHEED measurements have been made on the surface of GaAs crystals during in situ epitaxial deposition. The (bulk) spot pattern changes to a streak pattern as deposition proceeds, as noted by other workers. An interpretation of these patterns is given in terms of simple kinematic scatttering from flat surface regions. This leads to a straightforward interpretation of the observed specular reflection phenomenon, enables the area of coherent scattering to be estimated (0.16 μ2 in the present experiments), and should permit a more detailed analysis of ordered surface structures." @default.
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- W2043559114 date "1973-04-01" @default.
- W2043559114 modified "2023-09-27" @default.
- W2043559114 title "Interpretation of scanning high-energy electron diffraction measurements with application to GaAs surfaces" @default.
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- W2043559114 doi "https://doi.org/10.1063/1.1662472" @default.
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