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• W2043808309 endingPage "325" @default.
• W2043808309 startingPage "317" @default.
• W2043808309 abstract "Power electronic devices are susceptible to catastrophic failures when they are exposed to energetic particles; the most serious failure mechanism is single event burnout (SEB). SEB is a widely recognized problem for space applications, but it also may affect devices in terrestrial applications. This phenomenon has been studied in detail for power MOSFETs, but much less is known about the mechanisms responsible for SEB in power diodes. This paper reviews the current state-of-knowledge of power-diode vulnerability to SEB, based on both experimental and simulation results. It is shown that present models are limited by the lack of detailed descriptions of thermal processes that lead to physical failure." @default.
• W2043808309 created "2016-06-24" @default.
• W2043808309 creator A5007982912 @default.
• W2043808309 creator A5027230074 @default.
• W2043808309 creator A5035965053 @default.
• W2043808309 creator A5075080589 @default.
• W2043808309 date "2006-02-01" @default.
• W2043808309 modified "2023-09-29" @default.
• W2043808309 title "Single event burnout in power diodes: Mechanisms and models" @default.
• W2043808309 cites W1578331379 @default.
• W2043808309 cites W1982821622 @default.
• W2043808309 cites W1993559311 @default.
• W2043808309 cites W2009671175 @default.
• W2043808309 cites W2014718851 @default.
• W2043808309 cites W2021811220 @default.
• W2043808309 cites W2025265235 @default.
• W2043808309 cites W2032260800 @default.
• W2043808309 cites W2046698147 @default.
• W2043808309 cites W2052149185 @default.
• W2043808309 cites W2085784120 @default.
• W2043808309 cites W2089659598 @default.
• W2043808309 cites W2095808268 @default.
• W2043808309 cites W2095993155 @default.
• W2043808309 cites W2106064927 @default.
• W2043808309 cites W2108652723 @default.
• W2043808309 cites W2114770268 @default.
• W2043808309 cites W2117723979 @default.
• W2043808309 cites W2117797769 @default.
• W2043808309 cites W2129757052 @default.
• W2043808309 cites W2133818889 @default.
• W2043808309 cites W2158529122 @default.
• W2043808309 cites W2163297381 @default.
• W2043808309 cites W2408628356 @default.
• W2043808309 doi "https://doi.org/10.1016/j.microrel.2005.06.015" @default.
• W2043808309 hasPublicationYear "2006" @default.
• W2043808309 type Work @default.
• W2043808309 sameAs 2043808309 @default.
• W2043808309 citedByCount "32" @default.
• W2043808309 countsByYear W20438083092013 @default.
• W2043808309 countsByYear W20438083092015 @default.
• W2043808309 countsByYear W20438083092016 @default.
• W2043808309 countsByYear W20438083092017 @default.
• W2043808309 countsByYear W20438083092018 @default.
• W2043808309 countsByYear W20438083092019 @default.
• W2043808309 countsByYear W20438083092020 @default.
• W2043808309 countsByYear W20438083092021 @default.
• W2043808309 countsByYear W20438083092022 @default.
• W2043808309 countsByYear W20438083092023 @default.
• W2043808309 crossrefType "journal-article" @default.
• W2043808309 hasAuthorship W2043808309A5007982912 @default.
• W2043808309 hasAuthorship W2043808309A5027230074 @default.
• W2043808309 hasAuthorship W2043808309A5035965053 @default.
• W2043808309 hasAuthorship W2043808309A5075080589 @default.
• W2043808309 hasConcept C112987892 @default.
• W2043808309 hasConcept C119599485 @default.
• W2043808309 hasConcept C121332964 @default.
• W2043808309 hasConcept C127413603 @default.
• W2043808309 hasConcept C143916079 @default.
• W2043808309 hasConcept C159985019 @default.
• W2043808309 hasConcept C163258240 @default.
• W2043808309 hasConcept C171146098 @default.
• W2043808309 hasConcept C192562407 @default.
• W2043808309 hasConcept C200601418 @default.
• W2043808309 hasConcept C24326235 @default.
• W2043808309 hasConcept C2779662365 @default.
• W2043808309 hasConcept C3018344627 @default.
• W2043808309 hasConcept C38652104 @default.
• W2043808309 hasConcept C41008148 @default.
• W2043808309 hasConcept C62520636 @default.
• W2043808309 hasConcept C78434282 @default.
• W2043808309 hasConcept C89611455 @default.
• W2043808309 hasConcept C95713431 @default.
• W2043808309 hasConceptScore W2043808309C112987892 @default.
• W2043808309 hasConceptScore W2043808309C119599485 @default.
• W2043808309 hasConceptScore W2043808309C121332964 @default.
• W2043808309 hasConceptScore W2043808309C127413603 @default.
• W2043808309 hasConceptScore W2043808309C143916079 @default.
• W2043808309 hasConceptScore W2043808309C159985019 @default.
• W2043808309 hasConceptScore W2043808309C163258240 @default.
• W2043808309 hasConceptScore W2043808309C171146098 @default.
• W2043808309 hasConceptScore W2043808309C192562407 @default.
• W2043808309 hasConceptScore W2043808309C200601418 @default.
• W2043808309 hasConceptScore W2043808309C24326235 @default.
• W2043808309 hasConceptScore W2043808309C2779662365 @default.
• W2043808309 hasConceptScore W2043808309C3018344627 @default.
• W2043808309 hasConceptScore W2043808309C38652104 @default.
• W2043808309 hasConceptScore W2043808309C41008148 @default.
• W2043808309 hasConceptScore W2043808309C62520636 @default.
• W2043808309 hasConceptScore W2043808309C78434282 @default.
• W2043808309 hasConceptScore W2043808309C89611455 @default.
• W2043808309 hasConceptScore W2043808309C95713431 @default.
• W2043808309 hasIssue "2-4" @default.
• W2043808309 hasLocation W20438083091 @default.
• W2043808309 hasOpenAccess W2043808309 @default.
• W2043808309 hasPrimaryLocation W20438083091 @default.
• W2043808309 hasRelatedWork W1987137857 @default.
• W2043808309 hasRelatedWork W2009194678 @default.
• W2043808309 hasRelatedWork W2042647491 @default.

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