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• W2043917708 abstract "thin films, with x = 0.14 and 0.23, were prepared from alternate Al and Fe layers by irradiation with a Xe beam at two different temperatures in order to reach either the amorphous or the quasicrystalline state. Through thermal treatment, crystalline alloys are obtained. Rutherford back-scattering spectrometry of -particles and transmission electron microscopy have been used to characterize the atomic distribution and structural state of the samples. X-ray emission spectroscopy and conversion electron Mössbauer spectroscopy provided information about the electronic distributions whereas electrical resistivity measurements allowed us to determine the metallic character of the compounds. The existence of a pseudo-gap and dehybridization of the s and d electronic states of Fe are suggested to interpret the high-resistivity behaviour and the isomer shift values, measured in the Fe concentration range studied here." @default.
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• W2043917708 date "1996-05-20" @default.
• W2043917708 modified "2023-10-06" @default.
• W2043917708 title "Structural and electronic properties of ion-beam-prepared samples" @default.
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• W2043917708 doi "https://doi.org/10.1088/0953-8984/8/21/011" @default.
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