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- W2044051034 abstract "The problem of the dependence of capacitance for a planar junction of arbitrary plane geometry with an arbitrary impurity profile on applied voltage is discussed. It contains the solution of the problem for cylindric and spherical junctions, what is essential in taking into account the lateral capacitances in the planar junction capacitance calculation. It is shown that the size of intermediate region, located between the depletion layer and the quasi-neutral region is for symmetrical junctions of the range of the Debye length. It is mentioned, that for a planar junction with typical junction depth and small surface, the capacitances of lateral junctions are comparable with capacitance of its plane part.Das Problem der Abhangigkeit der Kapazitat von der Spannung fur den Planar-Halbleiterubergang mit beliebiger Flachgeometrie und beliebiger Dotierung wird untersucht und Losungen fur den zylindrischen und spharischen Ubergang angegeben, was fur die Berucksichtigung der seitlichen Kapazitaten bei der Berechnung der Planarubergangskapazitat wesentlich ist. Es wird gezeigt, das fur den Planartransistor mit typischer Ubergangstiefe und kleiner Oberflache, die seitlichen Ubergangskapazitaten vergleichbar mit der Kapazitat des ebenen Teiles des Ubergangs sind." @default.
- W2044051034 created "2016-06-24" @default.
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- W2044051034 date "1978-01-16" @default.
- W2044051034 modified "2023-09-25" @default.
- W2044051034 title "Numerical calculation of the capacitance of the planar p–n junction" @default.
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- W2044051034 doi "https://doi.org/10.1002/pssa.2210450116" @default.
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