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• W2044185845 abstract "An RC oscillator using amorphous silicon thin film transistors was developed. The oscillation frequency and its dependence on resistance and bias voltage were studied. The frequency was controlled by adjusting the feedback resistance of the oscillator. The highest measured frequency of the oscillator was around 140 kHz, which is acceptable for low-end radio frequency identification (RFID). Since a low-end RFID circuit needs low cost and a simple process, an amorphous silicon oscillator is suitable." @default.
• W2044185845 created "2016-06-24" @default.
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• W2044185845 date "2006-02-08" @default.
• W2044185845 modified "2023-10-13" @default.
• W2044185845 title "Stability of an Amorphous Silicon Oscillator" @default.
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• W2044185845 doi "https://doi.org/10.4218/etrij.06.0105.0104" @default.
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