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- W2044298975 abstract "The surface mophology of thin-film recording media is important for recording characteristics. STM analysis was done for iron oxide thin films prepared by a water vapor added rf-sputtering process.1 They were oxidized in an open air in the temperature range 300–350 °C in order to transfer magnetite thin films to gamma iron oxide thin films. The STM image of gamma iron oxide thin film is not much different from the as-sputtered thin film, although the surface roughness increased a little; it is less than 200 Å." @default.
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- W2044298975 date "1991-04-15" @default.
- W2044298975 modified "2023-09-23" @default.
- W2044298975 title "The topography of iron oxide thin films (abstract)" @default.
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- W2044298975 doi "https://doi.org/10.1063/1.347868" @default.
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