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• W2044509764 abstract "In this paper, we report on an avalanche photodiode (APD) fabricated in a standard 0.35-mum CMOS technology. The main electrooptical characteristics of the device are presented, showing a remarkably low-noise factor if compared to other CMOS APDs. An estimation of the noise properties of a pixel based on the proposed photodiode with charge-amplifier readout is performed, showing that it could have an improved noise performance with respect to a standard photodiode-based pixel." @default.
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• W2044509764 date "2008-01-01" @default.
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• W2044509764 title "Low-Noise Avalanche Photodiode in Standard 0.35-$mu hbox{m}$ CMOS Technology" @default.
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• W2044509764 doi "https://doi.org/10.1109/ted.2007.910570" @default.
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