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- W2044688675 abstract "The effects of compositional intermixing and high interfacial roughness in a series of CdS/Cu(In,Ga)Se2 heterojunctions have been investigated using the technique of angular dependence of x-ray fluorescence. In the present case, the average interfacial roughness actually exceeds the nominal thickness of CdS film. A method of data analysis has been worked out to account for the large roughness and this technique allows a possibility of nondestructive determination of the concentration profile of both CdS and Cu(In,Ga)Se2 as well as the effective roughness parameters in the system." @default.
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- W2044688675 date "2002-05-13" @default.
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- W2044688675 title "Compositional intermixing at CdS/Cu(In,Ga)Se[sub 2] rough interface studied by x-ray fluorescence" @default.
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- W2044688675 doi "https://doi.org/10.1063/1.1471388" @default.
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