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- W2044740765 abstract "This paper reviews failure analysis methods and discusses the merits and pitfalls associated with some of the more common techniques as they relate to electrostatic discharge (ESD). Although advanced methods such as the focused ion beam will be discussed, the importance of more traditional methods such as liquid crystal, emission microscopy, passive voltage contrast and mechanical polishing will be emphasized. Case histories are based on ESD related failure analysis; however, many of the references cover general failure analysis methodology." @default.
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- W2044740765 date "1998-11-01" @default.
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- W2044740765 title "ESD failure analysis methodology" @default.
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- W2044740765 doi "https://doi.org/10.1016/s0026-2714(98)00173-5" @default.
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