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• W2044998220 abstract "Bias-dependent features of the insulating NaCl layer grown on Cu(001) have been investigated by scanning tunneling microscopy/spectroscopy (STM/STS). The apparent layer thickness of the NaCl film is variable at bias voltages ranging from 2.8 to 3.2 V as well as from 4.0 to 5.0 V, and the Moiré pattern induced by NaCl–Cu lattice mismatch also shows bias dependence. The z–V (dz/dV–V) curves and dI/dV mapping measurements reveal that the resonant tunneling between the image potential states (IPSs) on Cu(001) and the Fermi level of the STM tip leads to drastic variations of these features." @default.
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• W2044998220 date "2010-09-01" @default.
• W2044998220 modified "2023-10-16" @default.
• W2044998220 title "Bias dependence of apparent layer thickness and Moiré pattern on NaCl/Cu(001)" @default.
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• W2044998220 doi "https://doi.org/10.1016/j.susc.2010.07.013" @default.
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