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- W2045081320 abstract "SiC MOSFETs are expected to have higher thermal runaway temperature, compared with other SiC power devices. In this paper, high temperature stability of SiC MOSFETs is investigated by experiments and simulations. At room temperature, the maximum steady-state junction temperature of the SiC MOSFET is measured to exceed 270°C and saber simulations based on experimental model reproduce the thermal process." @default.
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- W2045081320 date "2014-06-01" @default.
- W2045081320 modified "2023-09-25" @default.
- W2045081320 title "High temperature stability evaluation of SiC MOSFETs" @default.
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- W2045081320 doi "https://doi.org/10.1109/ispsd.2014.6856037" @default.
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