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• W2045339826 abstract "The electroreflectance (ER) of SbSI has been measured in a wide temperature range between 1.6 and 3.3 eV with linearly polarized light. The technique of transverse ER was used and the first and second harmonics of ER were measured simultaneously. The effects of domain reorientation, complementary light illumination, the specimen damping and electric field vector rotation on the sample surface are investigated. It is shown: (a) that the induced reflectivity change is not caused by purely Kern-Harbeke-effect, but depends on the piezoelectric strain; (b) that separated from the deformation component, the ER spectrum is close to the λ-modulation spectrum and may be interpreted in a similar way." @default.
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• W2045339826 date "1978-01-01" @default.
• W2045339826 modified "2023-09-24" @default.
• W2045339826 title "Electroreflectance in SbSI" @default.
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• W2045339826 doi "https://doi.org/10.1080/00150197808236816" @default.
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