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- W2045461000 abstract "Interface roughness effects in ITO-Ta2O5-ZnS:Pr,Ce-Ta2O5-Al structures were investigated as a function of thickness of dielectric layer. Internal charge-phosphor field (Qint-Fp) analysis and capacitance-voltage analysis(C-V) showed that the steady state phosphor field is more smaller and C-V curve in transition region less steeper with increasing root-mean-square-roughness between dielectric and phosphor layer. The experimental results demonstrate that interface roughness is one of the physical factors to change the electrical performance of ACTFEL devices." @default.
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- W2045461000 date "1998-01-01" @default.
- W2045461000 modified "2023-10-17" @default.
- W2045461000 title "An Improved Understanding on the Relationship between Interface Roughness of ZnS:Pr,Ce Phosphor-Ta[sub 2]O[sub 5] Insulating Film and Electrical Characteristics of TFEL Devices" @default.
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- W2045461000 doi "https://doi.org/10.1889/1.1833845" @default.
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