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- W2045860699 abstract "Reevaluation and recalculation of thermally stimulated current (TSC) data from semi-insulating (SI) GaAs, published by many different authors over a period of three decades were done by means of the new analytical method, simultaneous multiple peak analysis (SIMPA). The SIMPA procedure clearly resolved contributions from various overlapping TSC peaks and enabled the precise determination of signatures (activation energy, Ea and capture cross section, σ) of all observed deep traps. The analyzed TSC spectra refer to SI GaAs samples that have been grown/treated in quite different ways (various growth techniques, growth under As or Ga rich conditions, different annealing procedures, irradiation with neutrons, γ rays, etc.). Although the SIMPA procedure was applied to apparently quite different TSC spectra, in all cases excellent fits were achieved, with the unique set (or subset from it) of eleven different deep traps, the only difference being in relative and absolute concentrations of traps. Despite a broad..." @default.
- W2045860699 created "2016-06-24" @default.
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- W2045860699 date "2000-01-01" @default.
- W2045860699 modified "2023-09-26" @default.
- W2045860699 title "Complete set of deep traps in semi-insulating GaAs" @default.
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- W2045860699 doi "https://doi.org/10.1063/1.1308072" @default.
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