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• W2046588838 abstract "Resistivity of individual molecular-assembly nanowires was characterized using the point-contact current-imaging atomic force microscope (PCI-AFM). Current images were simultaneously obtained along with topographic images, from which the mean electrical resistivity of each nanowire was deduced to be approximately 180Ωcm, which was about two orders of magnitude lower than that measured on bulk Langmuir–Blodgett films (103–105Ωcm)." @default.
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• W2046588838 date "2008-10-27" @default.
• W2046588838 modified "2023-09-27" @default.
• W2046588838 title "Electrical resistivity of individual molecular-assembly nanowires of amphiphilic bis-tetrathiafulvalene macrocycle/2,3,5,6-tetrafluoro- 7,7,8,8-tetracyano-p-quinodimethane charge transfer complex characterized by point-contact current-imaging atomic force microscopy" @default.
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• W2046588838 doi "https://doi.org/10.1063/1.3009556" @default.
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