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- W2046779690 abstract "In this paper, the contribution of leakage to the hysteresis curve in thin film ferroelectric capacitors is analysed quantitatively by applying a very simple circuit model and experiment. Based on our previous analysis of current - voltage characteristics in thin film ferroelectric capacitors, the deformed hysteresis loops due to leakage are calculated with respect to various barriers and frequencies, and are verified with our laser ablated thin film capacitors. Some interesting phenomena, such as gap in hysteresis curves, vertical drift of hysteresis loops, etc, are discussed." @default.
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- W2046779690 date "1996-07-14" @default.
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- W2046779690 title "Drift and deformation of the hysteresis curve in thin film ferroelectric capacitors with conductance" @default.
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- W2046779690 doi "https://doi.org/10.1088/0022-3727/29/7/040" @default.
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