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- W2047343580 abstract "In this paper, we derive the input referred noise in terms of the on-pixel transistor device dimensions of the main noise sources of our array, namely, the flicker noise of the pixel thin-film transistors (TFTs), and the reset noise. Theoretical calculations and simulation results show that it is desirable to minimize the amplifier TFT gate dimensions, L<sub>1</sub> and W<sub>1</sub>, and to maximize the read-out TFT gate width, W<sub>2</sub>. Noise curves are presented as a function of transistor dimensions, allowing the designer to choose appropriate device dimensions when designing flat-panel imaging circuits. In addition, it is demonstrated how the optimal amplifier TFT gate width, W<sub>1</sub>, for the lowest-noise design, changes as a function of the extraneous sense node capacitance. The noise simulations indicate that with proper device dimension design, it is possible to achieve sub-500 electron input referred noise performance." @default.
- W2047343580 created "2016-06-24" @default.
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- W2047343580 date "2007-06-07" @default.
- W2047343580 modified "2023-09-23" @default.
- W2047343580 title "Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy" @default.
- W2047343580 doi "https://doi.org/10.1117/12.717545" @default.
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