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- W2048478422 abstract "The influence of electrical contacts upon coplanar electrode photocurrent response times has been explored in undoped amorphous hydrogenated silicon (a-Si:H) by measuring contact-induced photocurrents in a virtual ground plane. The results indicate that the relatively long photocurrent response times observed in undoped a-Si:H cannot be attributed to contacts. The response times are evidence that some deep-lying defects in a-Si:H are true electron photocarrier traps and not recombination centers. The discrepancy between long-time coplanar and time-of-flight transient photocurrent measurements upon undoped a-Si:H remains unresolved." @default.
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- W2048478422 date "1986-04-21" @default.
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- W2048478422 title "Photocurrent response times in undoped amorphous hydrogenated silicon" @default.
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- W2048478422 doi "https://doi.org/10.1063/1.96606" @default.
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