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- W2049103265 abstract "Electrical transport and optical properties of transition-metal silicides are reviewed. They are integrated with thermal properties of single-crystal silicides. Most of these compounds behave as metals while some of them behave as semiconductors. The former show an increasing electrical resistivity ρ with increasing temperature. Several of them show a non-classical deviation of ρ(T) from linearity in the high-temperature limit. This deviation, related to intrinsic properties of the compound, can be affected both in sign and in amount by the presence of foreign atoms (impurities) and structural defects. Moreover, defects dominate the electrical transport at low temperatures both in metallic and semiconducting compounds. Therefore, the interpretation of the electrical properties measured as a function of temperature may give a non-realistic description of silicide intrinsic properties. Since also other physical properties, like thermal and optical ones, can be strongly affected by impurities and defects, results about single-crystal silicides will be first illustrated. Single-crystal preparation and structural characterization are described in detail, with emphasis on crystalline quality in terms of residual resistivity ratio. The electrical quantities, resistivity and magnetoresistance, are measured as a function of temperature and along the main crystallographic directions. The effect of impurities and defects on the transport properties is then evaluated by examining the electrical transport of polycrystalline thin-film silicides. The different contributions to the total resistivity are measured by changing: (i) film stoichiometry, (ii) impurity concentration, (iii) texture growth and (iv) film thickness. Hall-coefficient measurements are briefly discussed with the main purpose to evidence that great caution is necessary when deducing mobility and charge-carrier density values from these data. The theoretical models currently used to interpret the low- and high-temperature resistivity behavior of the metallic silicides are presented and used to fit the experimental resistivity curves. The results of these studies reveal that in several cases there are well-defined temperature ranges in which a specific electron—phonon scattering mechanism dominates. This allows a more detailed study of the microscopic processes. The optical functions from the far-infrared to the vacuum ultraviolet, derived from Kramers—Krönig analysis of reflectance spectra or directly measured by spectroscopic ellipsometry, are presented and discussed for some significant metallic disilicides, both single crystals and polycrystalline films. Different physical phenomena are distinguished in the spectra: intraband transitions at the lowest photon energies, interband transitions at higher energies, and collective oscillations. In particular, the free-carrier response derived from this analysis is compared with the transport results. The interpretation of the experimental spectra is based on the calculated electronic structures or optical functions. Moreover, it is shown how the optical studies contribute to assess definitively the semiconducting character of some disilicides. Specific-heat measurements on single crystals between 0.1 and 8 K are reported. The Debye temperature and the density of electronics states at the Fermi surface are deduced from the lattice and electronic contributions, respectively. Some silicides have been found superconductors with small electron—phonon coupling constants. Emphasis is given to the comparison between the properties deduced from these studies and those obtained from the analysis of electrical transport data. The final part of this review is devoted to the calculation of some microscopic physical quantities, as for example the electron mean free path, the charge-carrier density, the Fermi velocity. The parameters of the best fit to the experimental resistivity curves, the free-carrier parameters obtained from infrared spectra and the density of electronic states at the Fermi surface determined from specific-heat measurements were used in such evaluations." @default.
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- W2049103265 date "1993-02-01" @default.
- W2049103265 modified "2023-10-18" @default.
- W2049103265 title "Electrical and optical properties of silicide single crystals and thin films" @default.
- W2049103265 cites W111836676 @default.
- W2049103265 cites W128724105 @default.
- W2049103265 cites W1604523731 @default.
- W2049103265 cites W1619165782 @default.
- W2049103265 cites W1632329897 @default.
- W2049103265 cites W1653802459 @default.
- W2049103265 cites W17947101 @default.
- W2049103265 cites W1967822634 @default.
- W2049103265 cites W1968785143 @default.
- W2049103265 cites W1969779276 @default.
- W2049103265 cites W1971182786 @default.
- W2049103265 cites W1972759303 @default.
- W2049103265 cites W1975836473 @default.
- W2049103265 cites W1976656179 @default.
- W2049103265 cites W1977442751 @default.
- W2049103265 cites W1977924701 @default.
- W2049103265 cites W1979827172 @default.
- W2049103265 cites W1980326240 @default.
- W2049103265 cites W1981098090 @default.
- W2049103265 cites W1982646321 @default.
- W2049103265 cites W1983951206 @default.
- W2049103265 cites W1985148391 @default.
- W2049103265 cites W1987089006 @default.
- W2049103265 cites W1987481566 @default.
- W2049103265 cites W1990084694 @default.
- W2049103265 cites W1990769624 @default.
- W2049103265 cites W1990989521 @default.
- W2049103265 cites W1993126552 @default.
- W2049103265 cites W1995783597 @default.
- W2049103265 cites W1995809548 @default.
- W2049103265 cites W1997108180 @default.
- W2049103265 cites W1999109177 @default.
- W2049103265 cites W1999620796 @default.
- W2049103265 cites W2007075247 @default.
- W2049103265 cites W2007535812 @default.
- W2049103265 cites W2010639916 @default.
- W2049103265 cites W2011804906 @default.
- W2049103265 cites W2011874580 @default.
- W2049103265 cites W2012569931 @default.
- W2049103265 cites W2015469101 @default.
- W2049103265 cites W2018342014 @default.
- W2049103265 cites W2019307766 @default.
- W2049103265 cites W2019674013 @default.
- W2049103265 cites W2021006028 @default.
- W2049103265 cites W2021088372 @default.
- W2049103265 cites W2023315302 @default.
- W2049103265 cites W2024143702 @default.
- W2049103265 cites W2026056346 @default.
- W2049103265 cites W2028080264 @default.
- W2049103265 cites W2028162531 @default.
- W2049103265 cites W2028705788 @default.
- W2049103265 cites W2030182885 @default.
- W2049103265 cites W2030239281 @default.
- W2049103265 cites W2035513427 @default.
- W2049103265 cites W2035846883 @default.
- W2049103265 cites W2036776240 @default.
- W2049103265 cites W2038755785 @default.
- W2049103265 cites W2042391176 @default.
- W2049103265 cites W2042659892 @default.
- W2049103265 cites W2042928135 @default.
- W2049103265 cites W2043911107 @default.
- W2049103265 cites W2043926397 @default.
- W2049103265 cites W2045408160 @default.
- W2049103265 cites W2047496602 @default.
- W2049103265 cites W2048830863 @default.
- W2049103265 cites W2052334403 @default.
- W2049103265 cites W2054655027 @default.
- W2049103265 cites W2056396058 @default.
- W2049103265 cites W2056885837 @default.
- W2049103265 cites W2057330329 @default.
- W2049103265 cites W2057676993 @default.
- W2049103265 cites W2058727227 @default.
- W2049103265 cites W2059160150 @default.
- W2049103265 cites W2059367411 @default.
- W2049103265 cites W2060941008 @default.
- W2049103265 cites W2061079972 @default.
- W2049103265 cites W2063258684 @default.
- W2049103265 cites W2063481586 @default.
- W2049103265 cites W2064583797 @default.
- W2049103265 cites W2065932772 @default.
- W2049103265 cites W2067146040 @default.
- W2049103265 cites W2067196201 @default.
- W2049103265 cites W2068541301 @default.