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- W2051154572 abstract "Synchroton X-ray topography is used to study defects in (100) InP crystals doped with Sn, S and Zn to carrier concentrations ranging from 1017 to 2 × 1019 cm-3. Edge, screw and mixed dislocations having a Burgers vector 12a [110] have been found. The lowest dislocation densities (<100 cm-2) have been observed in heavily doped samples, which however always showed growth striations." @default.
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- W2051154572 date "1983-12-01" @default.
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- W2051154572 title "An examination of defects in InP single crystals grown by the liquid-encapsulated czochralski technique using synchrotron x-ray topography" @default.
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- W2051154572 doi "https://doi.org/10.1016/0022-0248(83)90332-9" @default.
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