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• W2051219175 abstract "Recently (IEEE Trans. Nucl. Sci., Vol. 60, No. 3, pp. 1876-1911, 2013), Reed published an anthology of contributions from different research groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The Tool suIte for rAdiation Reliability Assessment (TIARA) simulation platform and its development by STMicroelectronics and Aix-Marseille University is described in this paper as a complement to this anthology." @default.
• W2051219175 created "2016-06-24" @default.
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• W2051219175 date "2014-06-01" @default.
• W2051219175 modified "2023-10-18" @default.
• W2051219175 title "Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation" @default.
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• W2051219175 doi "https://doi.org/10.1109/tns.2014.2318778" @default.
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