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- W2051280518 abstract "Random Telegraph Noise (RTN) is one of the main reliability problems of resistive switching-based memories. To understand the physics behind RTN, a complete and accurate RTN characterization is required. The standard equipment used to analyse RTN has a typical time resolution of ∼2 ms which prevents evaluating fast phenomena. In this work, a new RTN measurement procedure, which increases the measurement time resolution to 2 μs, is proposed. The experimental set-up, together with the recently proposed Weighted Time Lag (W-LT) method for the analysis of RTN signals, allows obtaining a more detailed and precise information about the RTN phenomenon." @default.
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- W2051280518 date "2016-01-01" @default.
- W2051280518 modified "2023-10-03" @default.
- W2051280518 title "New high resolution Random Telegraph Noise (RTN) characterization method for resistive RAM" @default.
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- W2051280518 doi "https://doi.org/10.1016/j.sse.2015.08.010" @default.
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