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- W2051873239 abstract "This article describes the advantages of a photoelectric ellipsometer over a visual instrument for the measurement of the thickness of films from 1 A up to many thousand A. Experimental curves are given showing the unambiguous correlation between film thickness and position of two rotating elements, a λ/4 plate and an analyzing Nicol prism." @default.
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- W2051873239 date "1957-04-01" @default.
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- W2051873239 title "Improved Method to Measure the Thickness of Thin Films with a Photoelectric Ellipsometer" @default.
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- W2051873239 doi "https://doi.org/10.1063/1.1715860" @default.
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